"Impact of slow and fast oxide traps on In0.53Ga0.47As device operation ..."

Vamsi Putcha et al. (2018)

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DOI: 10.1109/IRPS.2018.8353603

access: closed

type: Conference or Workshop Paper

metadata version: 2021-10-14

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Vamsi Putcha, Jacopo Franco, Abhitosh Vais, Ben Kaczer, S. Sioncke, Dimitri Linten, Guido Groeseneken:
Impact of slow and fast oxide traps on In0.53Ga0.47As device operation studied using CET maps. IRPS 2018: 5

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