"On the Frequency Dependence of Bulk Trap Generation During AC Stress in Si ..."

Narendra Parihar et al. (2019)

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DOI: 10.1109/IRPS.2019.8720577

access: closed

type: Conference or Workshop Paper

metadata version: 2023-06-28

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Narendra Parihar, Uma Sharma, Richard G. Southwick, Miaomiao Wang, James H. Stathis, Souvik Mahapatra:
On the Frequency Dependence of Bulk Trap Generation During AC Stress in Si and SiGe RMG P-FinFETs. IRPS 2019: 1-8

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