BibTeX record conf/irps/PariharSSWSM19

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@inproceedings{DBLP:conf/irps/PariharSSWSM19,
  author    = {Narendra Parihar and
               Uma Sharma and
               Richard G. Southwick and
               Miaomiao Wang and
               James H. Stathis and
               Souvik Mahapatra},
  title     = {On the Frequency Dependence of Bulk Trap Generation During {AC} Stress
               in Si and SiGe {RMG} P-FinFETs},
  booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2019, Monterey,
               CA, USA, March 31 - April 4, 2019},
  pages     = {1--8},
  publisher = {{IEEE}},
  year      = {2019},
  url       = {https://doi.org/10.1109/IRPS.2019.8720577},
  doi       = {10.1109/IRPS.2019.8720577},
  timestamp = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl    = {https://dblp.org/rec/conf/irps/PariharSSWSM19.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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