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"Time-dependent dielectric breakdown statistics in SiO2 and HfO2 ..."

Andrea Padovani, Luca Larcher (2018)

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DOI: 10.1109/IRPS.2018.8353552

access: closed

type: Conference or Workshop Paper

metadata version: 2019-01-22

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  - conf/irps/PadovaniL18
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Andrea Padovani, Luca Larcher:
Time-dependent dielectric breakdown statistics in SiO2 and HfO2 dielectrics: Insights from a multi-scale modeling approach. IRPS 2018: 3

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