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"Scaling trends and bias dependence of the soft error rate of 16 nm and 7 ..."
Balaji Narasimham et al. (2018)
- Balaji Narasimham, Saket Gupta, Daniel S. Reed, J. K. Wang, Nick Hendrickson, Hasan Taufique:
Scaling trends and bias dependence of the soft error rate of 16 nm and 7 nm FinFET SRAMs. IRPS 2018: 4
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