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"Demonstration of Bilayer Gate Insulator for Improved Reliability in ..."

Kalparupa Mukherjee et al. (2020)

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DOI: 10.1109/IRPS45951.2020.9129098

access: closed

type: Conference or Workshop Paper

metadata version: 2022-10-02

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  dblp key:
  - conf/irps/MukherjeeSMZMYG20
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  - https://dblp.org/rec/conf/irps/MukherjeeSMZMYG20
Kalparupa Mukherjee, Carlo De Santi, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini, Shuzhen You, Karen Geens, Matteo Borga, Benoit Bakeroot, Stefaan Decoutere:
Demonstration of Bilayer Gate Insulator for Improved Reliability in GaN-on-Si Vertical Transistors. IRPS 2020: 1-5

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