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"Evidence for temperature-dependent buffer-induced trapping in ..."

Matteo Meneghini et al. (2015)

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DOI: 10.1109/IRPS.2015.7112687

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-07

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  - conf/irps/MeneghiniSDBZMV15
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  - https://dblp.org/rec/conf/irps/MeneghiniSDBZMV15
Matteo Meneghini, Riccardo Silvestri, Stefano Dalcanale, Davide Bisi, Enrico Zanoni, Gaudenzio Meneghesso, Piet Vanmeerbeek, Abhishek Banerjee, Peter Moens:
Evidence for temperature-dependent buffer-induced trapping in GaN-on-silicon power transistors. IRPS 2015: 2

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