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ORCID"Charge Trapping in SiC MOSFETs under Constant Gate Current Stress: ..."
Alberto Marcuzzi et al. (2024)
- Alberto Marcuzzi, M. Avramenko, Carlo De Santi, Peter Moens, F. Geenen, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini:
Charge Trapping in SiC MOSFETs under Constant Gate Current Stress: Analysis Based on Charge Pumping Measurements. IRPS 2024: 1-5
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