"Vth and Ron Instability of GaN Power HEMTs with pGaN Gate Under Negative ..."

S. L. Longato et al. (2025)

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DOI: 10.1109/IRPS48204.2025.10983103

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type: Conference or Workshop Paper

metadata version: 2025-07-04

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S. L. Longato, Davide Favero, Arno Stockman, Arianna Nardo, Piet Vanmeerbeek, Marnix Tack, Gaudenzio Meneghesso, Enrico Zanoni, C. De Santi, Matteo Meneghini:
Vth and Ron Instability of GaN Power HEMTs with pGaN Gate Under Negative Gate Bias. IRPS 2025: 22

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