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"Investigation of data pattern effects on nitride charge lateral migration ..."
Y. H. Liu et al. (2018)
- Y. H. Liu, H. Y. Lin, C. M. Jiang, Tahui Wang, W. J. Tsai, T. C. Lu, K. C. Chen, Chih-Yuan Lu:
Investigation of data pattern effects on nitride charge lateral migration in a charge trap flash memory by using a random telegraph signal method. IRPS 2018: 6
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