"Electrical method to localize the high-resistance of nanoscale CoSi2 ..."

Ming-Yi Lee et al. (2018)

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DOI: 10.1109/IRPS.2018.8353624

access: closed

type: Conference or Workshop Paper

metadata version: 2019-05-31

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Ming-Yi Lee, T.-Y. Chang, W.-F. Hsueh, Li-Kuang Kuo, Ding-Jhang Lin, Yen-Hai Chao, U. J. Tzeng, Chih-Yuan Lu:
Electrical method to localize the high-resistance of nanoscale CoSi2 word-line for OTP memories. IRPS 2018: 6

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