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"Dielectric Thickness and Fin Width Dependent OFF-State Degradation in ..."

Akhil S. Kumar et al. (2023)

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DOI: 10.1109/IRPS48203.2023.10118346

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-07

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  dblp key:
  - conf/irps/KumarUSKPHH23
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Akhil S. Kumar, Michael J. Uren, Matthew D. Smith, Martin Kuball, Justin Parke, H. George Henry, Robert S. Howell:
Dielectric Thickness and Fin Width Dependent OFF-State Degradation in AlGaN/GaN SLCFETs. IRPS 2023: 1-4

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