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"Reliability of next-generation field-effect transistors with transition ..."
Yury Yu. Illarionov et al. (2018)
- Yury Yu. Illarionov, Aday J. Molina-Mendoza, Michael Waltl, Theresia Knobloch, Marco M. Furchi, Thomas Mueller, Tibor Grasser:
Reliability of next-generation field-effect transistors with transition metal dichalcogenides. IRPS 2018: 5
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