"Positive-bias temperature instability (PBTI) of GaN MOSFETs."

Alex Guo, Jesús A. del Alamo (2015)

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DOI: 10.1109/IRPS.2015.7112770

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-21

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Alex Guo, Jesús A. del Alamo:
Positive-bias temperature instability (PBTI) of GaN MOSFETs. IRPS 2015: 6

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