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"Reliability and Variability of Advanced CMOS Devices at Cryogenic ..."
Alexander Grill et al. (2020)
- Alexander Grill, Erik Bury, Jakob Michl
, Stanislav Tyaginov, Dimitri Linten, Tibor Grasser, Bertrand Parvais
, Ben Kaczer, Michael Waltl
, Iuliana P. Radu
:
Reliability and Variability of Advanced CMOS Devices at Cryogenic Temperatures. IRPS 2020: 1-6
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