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"Role of electron and hole trapping in the degradation and breakdown of ..."
David Z. Gao et al. (2018)
- David Z. Gao, Jack Strand
, Al-Moatasem El-Sayed, Alexander L. Shluger, Andrea Padovani, Luca Larcher:
Role of electron and hole trapping in the degradation and breakdown of SiO2 and HfO2 films. IRPS 2018: 5
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