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"Solving critical issues in 10nm technology using innovative laser-based ..."

Lesly Endrinal et al. (2018)

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DOI: 10.1109/IRPS.2018.8353622

access: closed

type: Conference or Workshop Paper

metadata version: 2019-09-24

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  dblp key:
  - conf/irps/EndrinalKRS18
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Lesly Endrinal, Rakesh Kinger, Lavakumar Ranganathan, Amit Sheth:
Solving critical issues in 10nm technology using innovative laser-based fault isolation and DFT diagnosis techniques. IRPS 2018: 6

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