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"GaN RF HEMT Reliability: Impact of Device Processing on I-V Curve ..."

Francesca Chiocchetta et al. (2022)

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DOI: 10.1109/IRPS48227.2022.9764510

access: closed

type: Conference or Workshop Paper

metadata version: 2024-08-04

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  - conf/irps/ChiocchettaSRMG22
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Francesca Chiocchetta, Carlo De Santi, Fabiana Rampazzo, Kalparupa Mukherjee, Jan Grünenpütt, Daniel Sommer, Hervé Blanck, Benoit Lambert, Andrea Gerosa, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini:
GaN RF HEMT Reliability: Impact of Device Processing on I-V Curve Stability and Current Collapse. IRPS 2022: 11

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