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"Endurance Evaluation on OTS-PCM Device using Constant Current Stress Scheme."

Wei-Chih Chien et al. (2022)

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DOI: 10.1109/IRPS48227.2022.9764481

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-08

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  dblp key:
  - conf/irps/ChienGCYGHYCKKL22
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  - https://dblp.org/rec/conf/irps/ChienGCYGHYCKKL22
Wei-Chih Chien, Lynne M. Gignac, Y. C. Chou, C. H. Yang, N. Gong, H. Y. Ho, C. W. Yeh, H. Y. Cheng, W. Kim, I. T. Kuo, E. K. Lai, C. W. Cheng, L. Buzi, A. Ray, C. S. Hsu, Robert L. Bruce, Matthew BrightSky, H. L. Lung:
Endurance Evaluation on OTS-PCM Device using Constant Current Stress Scheme. IRPS 2022: 7-1

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