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W. Kim
This is just a disambiguation page, and is not intended to be the bibliography of an actual person. Any publication listed on this page has not been assigned to an actual author yet. If you know the true author of one of the publications listed below, you are welcome to contact us.
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2020 – today
- 2024
- [c8]W. Kim, V. Pica, N. Jossart, Farrukh Yasin, Kurt Wostyn, S. Couet, Sidharth Rao:
A novel test and analysis scheme to elucidate tail bit characteristics in STT-MRAM arrays. IMW 2024: 1-4 - 2023
- [c7]Wei-Chih Chien, E. K. Lai, L. Buzi, C. W. Cheng, C. W. Yeh, A. Ray, Lynne M. Gignac, N. Gong, H. Y. Cheng, A. Grun, D. Y. Lee, W. Kim, A. Majumdar, Douglas M. Bishop, Robert L. Bruce, D. Daudelin, H. Y. Ho, M. J. BrightSky, H. L. Lung:
A Comprehensive Study on the Pillar Size of OTS-PCM Memory with an Optimized Process and Scaling Trends Down to Sub-10 nm for SCM Applications. IMW 2023: 1-4 - 2022
- [c6]Wei-Chih Chien, Lynne M. Gignac, Y. C. Chou, C. H. Yang, N. Gong, H. Y. Ho, C. W. Yeh, H. Y. Cheng, W. Kim, I. T. Kuo, E. K. Lai, C. W. Cheng, L. Buzi, A. Ray, Chia-Sheng Hsu, Robert L. Bruce, Matthew BrightSky, H. L. Lung:
Endurance Evaluation on OTS-PCM Device using Constant Current Stress Scheme. IRPS 2022: 7-1 - [c5]H. Fukutome, K. Suh, W. Kim, Y. Moriyama, S. Kang, B. Eom, J. Kim, C. Yoon, W. Kwon, Y. Chung, Y. Nam, Y. Kim, S. Park, J. Park, H.-J. Cho, K. Rim, S. D. Kwon:
Comprehensive Feasibility Study of Single FIN Transistors for Scaling Both Switching Energy and Device Footprint. VLSI Technology and Circuits 2022: 369-370 - [c4]Z. Wei, W. Kim, Z. Wang, L. Hu, D. Jung, J. Zhang, Y. Huai:
Accurate and Fast STT-MRAM Endurance Evaluation Using a Novel Metric for Asymmetric Bipolar Stress and Deep Learning. VLSI Technology and Circuits 2022: 373-374
2000 – 2009
- 2004
- [j1]Yeon-Jae Jung, Hoesam Jeong, Eunseok Song, Jungho Lee, Seung-Wook Lee, Donghyeon Seo, Inho Song, Sanghun Jung, Joonbae Park, Deog-Kyoon Jeong, Soo-Ik Chae, W. Kim:
A 2.4-GHz 0.25-μm CMOS dual-mode direct-conversion transceiver for bluetooth and 802.11b. IEEE J. Solid State Circuits 39(7): 1185-1190 (2004) - [c3]W. Kim, S. C. Oh, K. Yoon:
Intrusion Detection Based on Feature Transform Using Neural Network. International Conference on Computational Science 2004: 212-219
1990 – 1999
- 1992
- [c2]HyungJun Kim, W. Kim, C. C. Li:
A performance study of two wavelet-based edge detectors. ICPR (3) 1992: 302-306 - 1991
- [c1]W. Kim, Jaideep Srivastava:
Enhancing Real-Time DBMS Performance with Multiversion Data and Priority Based Disk Scheduling. RTSS 1991: 222-231
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