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"Test pattern generation to detect multiple faults in ROBDD based ..."

Toral Shah, Anzhela Yu. Matrosova, Virendra Singh (2017)

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DOI: 10.1109/IOLTS.2017.8046223

access: closed

type: Conference or Workshop Paper

metadata version: 2018-06-25

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Toral Shah, Anzhela Yu. Matrosova, Virendra Singh:
Test pattern generation to detect multiple faults in ROBDD based combinational circuits. IOLTS 2017: 211-212

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