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"Revisiting random access scan for effective enhancement of post-silicon ..."

Binod Kumar et al. (2017)

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DOI: 10.1109/IOLTS.2017.8046208

access: closed

type: Conference or Workshop Paper

metadata version: 2020-10-25

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  dblp key:
  - conf/iolts/0001JTPS17
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Binod Kumar, Ankit Jindal, Jaynarayan T. Tudu, Brajesh Pandey, Virendra Singh:
Revisiting random access scan for effective enhancement of post-silicon observability. IOLTS 2017: 132-137

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