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"Reliability of 28nm embedded RRAM for consumer and industrial products."

Christian Peters et al. (2022)

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DOI: 10.1109/IMW52921.2022.9779300

access: closed

type: Conference or Workshop Paper

metadata version: 2023-06-16

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  dblp key:
  - conf/imw2/PetersAHO22
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  - https://dblp.org/rec/conf/imw2/PetersAHO22
Christian Peters, Frank Adler, Karl Hofmann, Jan Otterstedt:
Reliability of 28nm embedded RRAM for consumer and industrial products. IMW 2022: 1-3

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