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"Influence of Interfacial Oxide Layers in Hf0.5Zr0.5O2 based ferroelectric ..."

Ruben Alcala et al. (2022)

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DOI: 10.1109/IMW52921.2022.9779287

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

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  dblp key:
  - conf/imw2/AlcalaMVMMS22
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  - https://dblp.org/rec/conf/imw2/AlcalaMVMMS22
Ruben Alcala, Furqan Mehmood, Pramoda Vishnumurthy, Terence Mittmann, Thomas Mikolajick, Uwe Schroeder:
Influence of Interfacial Oxide Layers in Hf0.5Zr0.5O2 based ferroelectric capacitors on reliability performance. IMW 2022: 1-4

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