"Triple Pulse Test (TPT) for Characterizing Power Loss in Magnetic ..."

Jun Wang, Xibo Yuan, Navid Rasekh (2020)

> Home

Details and statistics

DOI: 10.1109/IECON43393.2020.9255039

access: closed

type: Conference or Workshop Paper

metadata version: 2021-12-22

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/iecon/WangYR20
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/iecon/WangYR20
Jun Wang, Xibo Yuan, Navid Rasekh:
Triple Pulse Test (TPT) for Characterizing Power Loss in Magnetic Components in Analogous to Double Pulse Test (DPT) for Power Electronics Devices. IECON 2020: 4717-4724

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.