"A color vision system for microelectronics: Application to oxide thickness ..."

Matt Barth et al. (1986)

> Home

Details and statistics

DOI: 10.1109/ROBOT.1986.1087565

access: closed

type: Conference or Workshop Paper

metadata version: 2021-09-16

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/icra/BarthPWHHB86
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/icra/BarthPWHHB86
Matt Barth, Srinivasan Parthasarathy, Jing Wang, Evelyn Hu, Susan Hackwood, Gerardo Beni:
A color vision system for microelectronics: Application to oxide thickness measurements. ICRA 1986: 1242-1247

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.