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"Novel low thermal budget gate stack solutions for BTI reliability in ..."

Jacopo Franco et al. (2021)

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DOI: 10.1109/ICICDT51558.2021.9626482

access: closed

type: Conference or Workshop Paper

metadata version: 2022-08-04

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Jacopo Franco, Hiroaki Arimura, J.-F. de Marneffe, A. Vandooren, L.-Å. Ragnarsson, Zhicheng Wu, Dieter Claes, E. Dentoni Litta, N. Horiguchi, Kris Croes, Dimitri Linten, Tibor Grasser, Ben Kaczer:
Novel low thermal budget gate stack solutions for BTI reliability in future Logic Device technologies : Invited paper. ICICDT 2021: 1-4

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