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"EM-GAN: Data-Driven Fast Stress Analysis for Multi-Segment Interconnects."

Wentian Jin et al. (2020)

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DOI: 10.1109/ICCD50377.2020.00057

access: closed

type: Conference or Workshop Paper

metadata version: 2024-02-28

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  - conf/iccd/JinSSZT20
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Wentian Jin, Sheriff Sadiqbatcha, Zeyu Sun, Han Zhou, Sheldon X.-D. Tan:
EM-GAN: Data-Driven Fast Stress Analysis for Multi-Segment Interconnects. ICCD 2020: 296-303

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