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"A Statistical Gate-Delay Model Considering Intra-Gate Variability."

Ken-ichi Okada, Kento Yamaoka, Hidetoshi Onodera (2003)

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DOI: 10.1109/ICCAD.2003.1257915

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/iccad/OkadaYO03
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  persistent URL:
  - https://dblp.org/rec/conf/iccad/OkadaYO03
Ken-ichi Okada, Kento Yamaoka, Hidetoshi Onodera:
A Statistical Gate-Delay Model Considering Intra-Gate Variability. ICCAD 2003: 908-913

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