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"Electromigration Immortality Check considering Joule Heating Effect for ..."

Mohammadamir Kavousi, Liang Chen, Sheldon X.-D. Tan (2020)

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DOI: 10.1145/3400302.3415634

access: closed

type: Conference or Workshop Paper

metadata version: 2023-12-19

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  dblp key:
  - conf/iccad/KavousiCT20
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  persistent URL:
  - https://dblp.org/rec/conf/iccad/KavousiCT20
Mohammadamir Kavousi, Liang Chen, Sheldon X.-D. Tan:
Electromigration Immortality Check considering Joule Heating Effect for Multisegment Wires. ICCAD 2020: 6:1-6:8

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