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"Efficient path delay test generation based on stuck-at test generation ..."
Tsuyoshi Iwagaki et al. (2007)
- Tsuyoshi Iwagaki, Satoshi Ohtake, Mineo Kaneko, Hideo Fujiwara:
Efficient path delay test generation based on stuck-at test generation using checker circuitry. ICCAD 2007: 418-423
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