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"RTL DFT techniques to enhance defect coverage for functional test sequences."

Hongxia Fang, Krishnendu Chakrabarty, Hideo Fujiwara (2009)

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DOI: 10.1109/HLDVT.2009.5340161

access: closed

type: Conference or Workshop Paper

metadata version: 2022-01-03

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Hongxia Fang, Krishnendu Chakrabarty, Hideo Fujiwara:
RTL DFT techniques to enhance defect coverage for functional test sequences. HLDVT 2009: 160-165

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