Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Mitigating the Effect of Reliability Soft-errors of RRAM Devices on the ..."

Amr M. S. Tosson et al. (2017)

> Home

Details and statistics

DOI: 10.1145/3060403.3060431

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-21

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/glvlsi/TossonYAW17
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/glvlsi/TossonYAW17
Amr M. S. Tosson, Shimeng Yu, Mohab H. Anis, Lan Wei:
Mitigating the Effect of Reliability Soft-errors of RRAM Devices on the Performance of RRAM-based Neuromorphic Systems. ACM Great Lakes Symposium on VLSI 2017: 53-58

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.