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"A Test Pattern Quality Metric for Diagnosis of Multiple Stuck-at and ..."

Sarmad Tanwir, Michael S. Hsiao, Loganathan Lingappan (2017)

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DOI: 10.1145/3060403.3060450

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Sarmad Tanwir, Michael S. Hsiao, Loganathan Lingappan:
A Test Pattern Quality Metric for Diagnosis of Multiple Stuck-at and Transition faults. ACM Great Lakes Symposium on VLSI 2017: 455-458

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