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"Overview of Ferroelectric Memory Devices and Reliability Aware Design ..."

Shan Deng et al. (2021)

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DOI: 10.1145/3453688.3461743

access: closed

type: Conference or Workshop Paper

metadata version: 2023-06-26

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Shan Deng, Zijian Zhao, Santosh Kurinec, Kai Ni, Yi Xiao, Tongguang Yu, Vijaykrishnan Narayanan:
Overview of Ferroelectric Memory Devices and Reliability Aware Design Optimization. ACM Great Lakes Symposium on VLSI 2021: 473-478

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