"Enhancing AMS Circuit Reliability: An Anomaly Dataset for Functional ..."

Sanjay Das et al. (2025)

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DOI: 10.1145/3716368.3735207

access: closed

type: Conference or Workshop Paper

metadata version: 2025-07-06

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Sanjay Das, Anand Menon, Omar Abiola Abioye, Afreen Fatimah Khazi-Syed, Jonathan Edward Lee, Ayush Arunachalam, Shamik Kundu, Pooja Madhusoodhanan, Prasanth Viswanathan Pillai, Rubin A. Parekhji, Arnab Raha, Suvadeep Banerjee, Suriyaprakash Natarajan, Kanad Basu:
Enhancing AMS Circuit Reliability: An Anomaly Dataset for Functional Safety Research in Automotive SoCs. ACM Great Lakes Symposium on VLSI 2025: 697-703

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