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"Integrated approach to area-time tradeoff for built-in-self-test in VLSI ..."
Anupam Basu et al. (1991)
- Anupam Basu, Thomas Charles Wilson, Dilip K. Banerji, Jayanti C. Majithia:
Integrated approach to area-time tradeoff for built-in-self-test in VLSI circuits. Great Lakes Symposium on VLSI 1991: 340-341

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