"Modeling and characterization of hot-carrier stress degradation in power ..."

Susanna Reggiani et al. (2013)

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DOI: 10.1109/ESSDERC.2013.6818826

access: closed

type: Conference or Workshop Paper

metadata version: 2021-05-05

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Susanna Reggiani, Elena Gnani, Antonio Gnudi, Giorgio Baccarani, Stefano Poli, Rick Wise, Ming-Yeh Chuang, Weidong Tian, Marie Denison:
Modeling and characterization of hot-carrier stress degradation in power MOSFETs (invited). ESSDERC 2013: 91-94

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