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"Random telegraph noise analysis to investigate the properties of active ..."

Francesco Maria Puglisi et al. (2013)

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DOI: 10.1109/ESSDERC.2013.6818845

access: closed

type: Conference or Workshop Paper

metadata version: 2017-06-02

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  - conf/essderc/PuglisiPPL13
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Francesco Maria Puglisi, Paolo Pavan, Andrea Padovani, Luca Larcher:
Random telegraph noise analysis to investigate the properties of active traps of HfO2-based RRAM in HRS. ESSDERC 2013: 166-169

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