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"Breakdown investigation in GaN-based MIS-HEMT devices."
Fabio Alessio Marino et al. (2014)
- Fabio Alessio Marino, Davide Bisi
, Matteo Meneghini
, Giovanni Verzellesi
, Enrico Zanoni
, Marleen Van Hove, Shuzhen You, Stefaan Decoutere, Denis Marcon, Steve Stoffels
, Nicolo Ronchi, Gaudenzio Meneghesso:
Breakdown investigation in GaN-based MIS-HEMT devices. ESSDERC 2014: 377-380
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