"Superior performance and Hot Carrier reliability of Strained FDSOI ..."

Guillaume Besnard et al. (2014)

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DOI: 10.1109/ESSDERC.2014.6948801

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-29

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Guillaume Besnard, Xavier Garros, François Andrieu, Phuong Nguyen, William van den Daele, Patrick Reynaud, Walter Schwarzenbach, Daniel Delprat, Konstantin Bourdelle, Gilles Reimbold, Sorin Cristoloveanu:
Superior performance and Hot Carrier reliability of Strained FDSOI nMOSFETs for advanced CMOS technology nodes. ESSDERC 2014: 226-229

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