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"Impact of Si/Al implantation on the forming voltage and pre-forming ..."

M. Barlas et al. (2016)

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DOI: 10.1109/ESSDERC.2016.7599613

access: closed

type: Conference or Workshop Paper

metadata version: 2023-06-16

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  dblp key:
  - conf/essderc/BarlasTGBBASJRM16
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  persistent URL:
  - https://dblp.org/rec/conf/essderc/BarlasTGBBASJRM16
M. Barlas, Boubacar Traore, Laurent Grenouillet, Stefania Bernasconi, Philippe Blaise, Mouhamad Alayan, Benoit Sklénard, Eric Jalaguier, Philippe Rodriguez, F. Mazen, E. Vilain, M. Guillermet, Simon Jeannot, Elisa Vianello, Luca Perniola:
Impact of Si/Al implantation on the forming voltage and pre-forming conduction modes in HfO2 based OxRAM cells. ESSDERC 2016: 168-171

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