"Dark Count Rate in Single-Photon Avalanche Diodes: Characterization and ..."

Mathieu Sicre et al. (2021)

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DOI: 10.1109/ESSCIRC53450.2021.9567806

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-06

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Mathieu Sicre, Megan Agnew, Christel Buj, Jean Coignus, Dominique Golanski, Rémi Helleboid, Bastien Mamdy, Isobel Nicholson, Sara Pellegrini, Denis Rideau, David Roy, Françis Calmon:
Dark Count Rate in Single-Photon Avalanche Diodes: Characterization and Modeling study. ESSCIRC 2021: 143-146

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