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"All-digital on-chip monitor for PMOS and NMOS process variability ..."

Tetsuya Iizuka et al. (2010)

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DOI: 10.1109/ESSCIRC.2010.5619899

access: closed

type: Conference or Workshop Paper

metadata version: 2020-04-27

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  - conf/esscirc/IizukaJNIA10
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Tetsuya Iizuka, Jaehyun Jeong, Toru Nakura, Makoto Ikeda, Kunihiro Asada:
All-digital on-chip monitor for PMOS and NMOS process variability measurement utilizing buffer ring with pulse counter. ESSCIRC 2010: 182-185

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