Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Massive Multisite Variability-Aware Die Distribution Estimation for ..."

Praise O. Farayola et al. (2021)

> Home

Details and statistics

DOI: 10.1109/DTIS53253.2021.9505144

access: closed

type: Conference or Workshop Paper

metadata version: 2022-07-26

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/dtis/FarayolaBCSRC21
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/dtis/FarayolaBCSRC21
Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen:
Massive Multisite Variability-Aware Die Distribution Estimation for Analog/Mixed-Signal Circuits Test Validation. DTIS 2021: 1-6

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.