"Regressive Testing for System-on-Chip with Unknown-Good-Yield."

Noh-Jin Park et al. (2003)

Details and statistics

DOI: 10.1109/DFTVS.2003.1250136

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

a service of  Schloss Dagstuhl - Leibniz Center for Informatics