"Techniques for Transient Fault Sensitivity Analysis and Reduction in VLSI ..."

Atul Maheshwari, Israel Koren, Wayne P. Burleson (2003)

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DOI: 10.1109/DFTVS.2003.1250160

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Atul Maheshwari, Israel Koren, Wayne P. Burleson:
Techniques for Transient Fault Sensitivity Analysis and Reduction in VLSI Circuits. DFT 2003: 597-

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