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"AF-Test: Adaptive-Frequency Scan Test Methodology for Small-Delay Defects."

Tsung-Yeh Li et al. (2010)

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DOI: 10.1109/DFT.2010.48

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

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  dblp key:
  - conf/dft/LiHHTHLMHBWTW10
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  persistent URL:
  - https://dblp.org/rec/conf/dft/LiHHTHLMHBWTW10
Tsung-Yeh Li, Shi-Yu Huang, Hsuan-Jung Hsu, Chao-Wen Tzeng, Chih-Tsun Huang, Jing-Jia Liou, Hsi-Pin Ma, Po-Chiun Huang, Jenn-Chyou Bor, Cheng-Wen Wu, Ching-Cheng Tien, Mike Wang:
AF-Test: Adaptive-Frequency Scan Test Methodology for Small-Delay Defects. DFT 2010: 340-348

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