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"Detecting intermittent resistive faults in digital CMOS circuits."

Hassan Ebrahimi, Alireza Rohani, Hans G. Kerkhoff (2016)

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DOI: 10.1109/DFT.2016.7684075

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
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  persistent URL:
  - https://dblp.org/rec/conf/dft/EbrahimiRK16
Hassan Ebrahimi, Alireza Rohani, Hans G. Kerkhoff:
Detecting intermittent resistive faults in digital CMOS circuits. DFT 2016: 87-90

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