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"A Rare Event Based Yield Estimation Methodology for Analog Circuits."

Izel Cagin Odabasi et al. (2018)

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DOI: 10.1109/DDECS.2018.00013

access: closed

type: Conference or Workshop Paper

metadata version: 2019-10-19

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  dblp key:
  - conf/ddecs/OdabasiYABPD18
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  - https://dblp.org/rec/conf/ddecs/OdabasiYABPD18
Izel Cagin Odabasi, Mustafa Berke Yelten, Engin Afacan, I. Faik Baskaya, Ali Emre Pusane, Günhan Dündar:
A Rare Event Based Yield Estimation Methodology for Analog Circuits. DDECS 2018: 33-38

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